Talks & Publications 2019

Conference Contributions 2019

Invited Talk at the TU Berlin and the Physikalisch-Technischen Bundesanstalt, Berlin, May 28, 2019
"High speed imaging and spectroscopy of X‐rays and particles with silicon detectors"
Lothar Strüder
Poster Presentation at the M & M Conference, Portland, OR, August 5, 2019
"Detection of low energy X-rays with high efficiency and spectral resolution"
Stefan Aschauer
Talk at the Denver X-ray Conference, Lombard, IL, August 6, 2019
"Detection of low energy X-rays with high efficiency and high spectral and position resolution"
Lothar Strüder
Talk at the ICXOM, Chicago, IL, August 8, 2019
"Detection of low energy X-rays with high efficiency and high spectral and spatial resolution"
Lothar Strüder
Invited Talk at the IHEP, Beijing, October 21, 2019
"High speed X-ray imaging and spectroscopy from 30 eV to 300 keV for synchrotron experiments"
Lothar Strüder
Talk at the IEEE NSS, Manchester, October 31, 2019
"A new spectroscopic imager for X-rays from 0.5 keV to 150 keV combining a fully depleted pnCCD coupled to a columnar CsI(Tl) scintillator with Fano limited energy resolution and deep subpixel spatial resolution"
Dieter Schlosser
Short Course at the IEEE Nuclear Science Symposium, Manchester, October, 2019
"Detection and Measurement of Radiation"
Lothar Strüder
Invited Talk at the ESA Conference: 20 Years of XMM-Newton in Space, Madrid, December 10, 2019
"The pnCCD camera on XMM-Newton"
Lothar Strüder


Publications 2019

Energy-dispersive Laue diffraction by means of a pnCCD detector coupled to a CsI(Tl) scintillator using ultra-hard X-ray synchrotron radiation
J. Synchrotron Rad. (2019). 26, 1612-1620; DOI:10.1107/S160057751900626X
M. Shokr, A. Tosson, A. Abboud, A. Algashi, D. Schlosser, R. Hartmann, M. Klaus, C. Genzel, L. Strüder and U. Pietsch
News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy
Microscopy and Microanalysis, 25(S2), 516-517; DOI:10.1017/S1431927619003313
Adrian Niculae, Thiago Barros, Alois Bechteler, Robert Lackner, Kathrin Hermenau, Klaus Heizinger, Tristan Mönninghoff, Heike Soltau and Lothar Strüder
Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium
Microscopy and Microanalysis, 25(S2), 1768-1769; DOI:10.1017/S1431927619009577
Adrian Niculae, Thiago Barros, Alois Bechteler, Kathrin Hermenau, Klaus Heizinger, Andreas Liebel, Heike Soltau and Lothar Strüder
Detection of Low Energy X-rays with High Efficiency and Spectral Resolution
Microscopy and Microanalysis, 25(S2), 272-273; DOI:10.1017/S1431927619002095
Lothar Strüder, Heike Soltau, Adrian Niculae, Stefan Aschauer, Robert Hartmann and Jeff Davies
Qualification and Integration Aspects of the DSSC Mega-Pixel X-Ray Imager
IEEE Transactions on Nuclear Science, vol. 66, no. 8, pp. 1966-1975, Aug. 2019; DOI:10.1109/TNS.2019.2927421
K. Hansen, ..., S. Aschauer, L. Strüder, et al.
EDLD-Tool: A real-time GPU-based tool to stream and analyze energy-dispersive Laue diffraction of BIG Data sets collected by a pnCCD
Journal of Instrumentation, Volume 14, January 2019, P01008; DOI:10.1088/1748-0221/14/01/P01008
A. Tosson, M. Shokr, A. Abboud, Y. Bebawy, A. Algashi, R. Hartmann, M. Klaus, C. Genzel, L. Strüder and U. Pietsch
Measuring Single Electrons – What Does it Mean?
Microscopy and Microanalysis, 25(S2), 1654-1655; DOI:10.1017/S1431927619009000
Ryll, H., Huth, M., Ritz, R., O'Leary, C., Griffiths, I., Nellist, P., ... Strüder, L.
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction
Ultramicroscopy, ISSN: 0304-3991, Vol: 196, Page: 74-82; DOI:10.1016/j.ultramic.2018.09.010
Christoph Mahr, Knut Müller-Caspary, Robert Ritz, Martin Simson et al.
Reduce Charging Effects on Beam Sensitive Material by Optimized Scanning Routines in SEM
Microscopy and Microanalysis, 25(S2), 474-475; DOI:10.1017/S1431927619003106
Maximilian Schmid, Andreas Liebel, Friederike Michael, Grigore Moldovan and Heike Soltau
Optimizing Workflow in Electron Microscopes with Fast BSE/STEM Diodes and Preamplifier Modules
Microscopy and Microanalysis, 25(S2), 538-539; DOI:10.1017/S1431927619003428
Maximilian Schmid, Andreas Liebel and Heike Soltau
Ultrafast Ptychography with 7500 Frames per Second
Microscopy and Microanalysis, 25(S2), 40-41; DOI:10.1017/S143192761900093X
Martin Huth, Robert Ritz, Colum M. O'Leary, Ian Griffiths, Peter Nellist and Heike Soltau