Talks & Publications 2016

Conference Contributions 2016

Keynote Talk at the TWD ATTRACT meeting, Barcelona, June 30, 2016
"The physical measurement limits of Semiconductor (Si) radiation detectors"
Lothar Strüder
NSLS II User Meeting, BNL NY, May 25, 2016
"Dedicated Silicon Detectors for Imaging and Spectroscopy at Synchrotron Light sources and X-ray Free Electron Lasers"
Lothar Strüder
SPIE, Edinburgh UK, June 26, 2016
"Properties of DePFET Active Pixel Sensors fabricated on 200 mm wafers as monolithic focal plane detectors for X-ray astronomy missions"
Lothar Strüder
SPIE, Edinburgh UK, June 30, 2016
"DEPFET sensors for high speed X-ray imaging"
Stefan Aschauer
Invited Talk, FEL Wworkshop, Heidelberg, June 28, 2016
"Challenges for X-ray Detectors at X-FELs"
Lothar Strüder
VCI - 14th Conference on Instrumentation, Wien, February 18, 2016
"The DePFET detector-amplifier structure for spectroscopic imaging in astronomy and for experiments at Free Electron Lasers"
Gerhard Lutz
Invited Talk, M&M, Columbus OH, July 27, 2016
"pnCCDs for XRD and XRF"
Lothar Strüder


Publications 2016

A pnCCD-based, fast direct single electron imaging camera for TEM and STEM
Journal of Instrumentation, Volume 11, April 2016; DOI:10.1088/1748-0221/11/04/P04006
H. Ryll, M. Simson, R. Hartmann, P. Holl, M. Huth, S. Ihle, A. Liebel, et al.
The DEPFET Detector-Amplifier Structure for Spectroscopic Imaging in Astronomy and for Experiments at Free Electron Lasers
Nuclear Instruments & Methods in Physics Research A: available online; DOI:doi:10.1016/j.nima.2016.04.049
G. Lutz, S. Aschauer, P. Majewski, P. Holl, L. Strüder
Controlled charge extraction - Antiblooming capabilities in pnCCD imaging sensors
Journal of Instrumentation, Volume 11, January 2016; DOI:10.1088/1748-0221/11/01/P01012
J. Schmidt, R. Hartmann, P. Holl, M. Huth, G. Lutz, ... H. Ryll, ... M. Simson, H. Soltau, J. Soltau, D. Steigenhöfer and L. Strüder
Direct and indirect signal detection of 122 keV photons with a novel detector combining a pnCCD and a CsI(Tl) scintillator
NIM A, Volume 805, 1 January 2016, Pages 55–62; DOI:10.1016/j.nima.2015.08.065
D.M. Schlosser, M. Huth. R. Hartmann, A. Abboud, S. Send, T. Conka-Nurdan, M. Shokr, U. Pietsch, L. Strüder
Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays
J. Appl. Cryst. (2016). 49; DOI:10.1107/S1600576715023997
Sebastian Send, ... Dieter Michael Schlosser, Martin Huth, Robert Hartmann, Lothar Strüder, et al.
A liquid jet setup for x-ray scattering experiments on complex liquids at free-electron laser sources
The Review of scientific instruments 87(6):063905; DOI:10.1063/1.4953921
I. Steinke, ... R. Hartmann, M. Huth, L. Strüder, et al.
The DEPFET Sensor-Amplifier Structure: A Method to Beat 1/f Noise and Reach Sub-Electron Noise in Pixel Detectors
Sensors 16(5):608; DOI:10.3390/s16050608
Gerhard Lutz, Matteo Porro, Stefan Aschauer, Stefan Wölfel, Lothar Strüder
Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-Ray Spectroscopy
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616001057
A. Niculae, A. Bechteler, R. Eckhardt, K. Hermenau, A. Liebel, G. Lutz, H. Soltau, L. Strüder
New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616001069
A. Niculae, A. Bechteler, R. Eckhardt, K. Hermenau, A. Liebel, G. Lutz, A. Schöning, H. Soltau, L. Strüder
Analysis of Polymorphs Using Simultaneous X-ray Fluorescence and Diffraction with an Imaging Spectrometer
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616001367
Jeffrey M. Davis, Julia Schmidt, Martin Huth, Robert Hartmann, Sebastian Ihle, Daniel Steigenhöfer, Heike Soltau, Lothar Strüder
Electric and Magnetic Field Mapping with the pnCCD (S)TEM Camera
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616002130
M. Huth, S. Ihle, R. Ritz, M. Simson, H. Soltau, V. Migunov, M. Duchamp, R. E. Dunin-Borkowski, H. Ryll and L. Strüder
Multivariate Statistical Analysis of Series of Diffraction Patterns
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003263
P. G. Kotula, M. H. Van Benthem, H. Ryll, M. Simson, and H. Soltau
High Speed, High Resolution Imaging Spectrometers Based on pnCCDs for XRF and XRD Applications
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S143192761600
L. Strüder, R. Hartmann, P. Holl, S. Ihle, M. Huth, J. Schmidt, Ch. Thamm, B. Kanngießer, J. Baumann, A. Renno, J. Grenzer, M. Radtke, A. Abboud, U. Pietsch, H. Soltau
How New Electron Detector Concepts Can Help to Increase Throughput and Sensitivity of Single- and Multi-Beam Scanning Electron Microscopes
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003846
A. Liebel, G. Lutz, U. Weber, M. Schmid, A. Niculae, H. Soltau
The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003184
P D Nellist, ... M Simson, M Huth, H Soltau, L Strüder, et al.
Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S143192761600341X
M. Simson, ... R. Hartmann, M. Huth, S. Ihle, ... R. Ritz, H. Ryll, J. Schmidt, H. Soltau, , et al.
Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning Using Ptychography Wigner-Distribution Deconvolution
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003391
H Yang, ... M Simson, M Huth, H Soltau, L Strüder, et al.
Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003275
Knut Müller-Caspary, ... Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, et al.