Talks & Publications 2016
Conference Contributions 2016
| Keynote Talk at the TWD ATTRACT meeting, Barcelona, June 30, 2016 "The physical measurement limits of Semiconductor (Si) radiation detectors" |
Lothar Strüder |
| NSLS II User Meeting, BNL NY, May 25, 2016 "Dedicated Silicon Detectors for Imaging and Spectroscopy at Synchrotron Light sources and X-ray Free Electron Lasers" |
Lothar Strüder |
| SPIE, Edinburgh UK, June 26, 2016 "Properties of DePFET Active Pixel Sensors fabricated on 200 mm wafers as monolithic focal plane detectors for X-ray astronomy missions" |
Lothar Strüder |
| SPIE, Edinburgh UK, June 30, 2016 "DEPFET sensors for high speed X-ray imaging" |
Stefan Aschauer |
| Invited Talk, FEL Wworkshop, Heidelberg, June 28, 2016 "Challenges for X-ray Detectors at X-FELs" |
Lothar Strüder |
| VCI - 14th Conference on Instrumentation, Wien, February 18, 2016 "The DePFET detector-amplifier structure for spectroscopic imaging in astronomy and for experiments at Free Electron Lasers" |
Gerhard Lutz |
| Invited Talk, M&M, Columbus OH, July 27, 2016 "pnCCDs for XRD and XRF" |
Lothar Strüder |
Publications 2016
| A pnCCD-based, fast direct single electron imaging camera for TEM and STEM Journal of Instrumentation, Volume 11, April 2016; DOI:10.1088/1748-0221/11/04/P04006 |
H. Ryll, M. Simson, R. Hartmann, P. Holl, M. Huth, S. Ihle, A. Liebel, et al. |
| The DEPFET Detector-Amplifier Structure for Spectroscopic Imaging in Astronomy and for Experiments at Free Electron Lasers Nuclear Instruments & Methods in Physics Research A: available online; DOI:doi:10.1016/j.nima.2016.04.049 |
G. Lutz, S. Aschauer, P. Majewski, P. Holl, L. Strüder |
| Controlled charge extraction - Antiblooming capabilities in pnCCD imaging sensors Journal of Instrumentation, Volume 11, January 2016; DOI:10.1088/1748-0221/11/01/P01012 |
J. Schmidt, R. Hartmann, P. Holl, M. Huth, G. Lutz, ... H. Ryll, ... M. Simson, H. Soltau, J. Soltau, D. Steigenhöfer and L. Strüder |
| Direct and indirect signal detection of 122 keV photons with a novel detector combining a pnCCD and a CsI(Tl) scintillator NIM A, Volume 805, 1 January 2016, Pages 55–62; DOI:10.1016/j.nima.2015.08.065 |
D.M. Schlosser, M. Huth. R. Hartmann, A. Abboud, S. Send, T. Conka-Nurdan, M. Shokr, U. Pietsch, L. Strüder |
| Application of a pnCCD for energy-dispersive Laue diffraction with ultra-hard X-rays J. Appl. Cryst. (2016). 49; DOI:10.1107/S1600576715023997 |
Sebastian Send, ... Dieter Michael Schlosser, Martin Huth, Robert Hartmann, Lothar Strüder, et al. |
| A liquid jet setup for x-ray scattering experiments on complex liquids at free-electron laser sources The Review of scientific instruments 87(6):063905; DOI:10.1063/1.4953921 |
I. Steinke, ... R. Hartmann, M. Huth, L. Strüder, et al. |
| The DEPFET Sensor-Amplifier Structure: A Method to Beat 1/f Noise and Reach Sub-Electron Noise in Pixel Detectors Sensors 16(5):608; DOI:10.3390/s16050608 |
Gerhard Lutz, Matteo Porro, Stefan Aschauer, Stefan Wölfel, Lothar Strüder |
| Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-Ray Spectroscopy Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616001057 |
A. Niculae, A. Bechteler, R. Eckhardt, K. Hermenau, A. Liebel, G. Lutz, H. Soltau, L. Strüder |
| New Opportunities with Oval-shaped Silicon Drift Detectors for High-Throughput EDX Analysis in Electron Microscopy Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616001069 |
A. Niculae, A. Bechteler, R. Eckhardt, K. Hermenau, A. Liebel, G. Lutz, A. Schöning, H. Soltau, L. Strüder |
| Analysis of Polymorphs Using Simultaneous X-ray Fluorescence and Diffraction with an Imaging Spectrometer Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616001367 |
Jeffrey M. Davis, Julia Schmidt, Martin Huth, Robert Hartmann, Sebastian Ihle, Daniel Steigenhöfer, Heike Soltau, Lothar Strüder |
| Electric and Magnetic Field Mapping with the pnCCD (S)TEM Camera Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616002130 |
M. Huth, S. Ihle, R. Ritz, M. Simson, H. Soltau, V. Migunov, M. Duchamp, R. E. Dunin-Borkowski, H. Ryll and L. Strüder |
| Multivariate Statistical Analysis of Series of Diffraction Patterns Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003263 |
P. G. Kotula, M. H. Van Benthem, H. Ryll, M. Simson, and H. Soltau |
| High Speed, High Resolution Imaging Spectrometers Based on pnCCDs for XRF and XRD Applications Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S143192761600 |
L. Strüder, R. Hartmann, P. Holl, S. Ihle, M. Huth, J. Schmidt, Ch. Thamm, B. Kanngießer, J. Baumann, A. Renno, J. Grenzer, M. Radtke, A. Abboud, U. Pietsch, H. Soltau |
| How New Electron Detector Concepts Can Help to Increase Throughput and Sensitivity of Single- and Multi-Beam Scanning Electron Microscopes Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003846 |
A. Liebel, G. Lutz, U. Weber, M. Schmid, A. Niculae, H. Soltau |
| The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003184 |
P D Nellist, ... M Simson, M Huth, H Soltau, L Strüder, et al. |
| Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S143192761600341X |
M. Simson, ... R. Hartmann, M. Huth, S. Ihle, ... R. Ritz, H. Ryll, J. Schmidt, H. Soltau, , et al. |
| Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D
Optical Sectioning Using Ptychography Wigner-Distribution Deconvolution Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003391 |
H Yang, ... M Simson, M Huth, H Soltau, L Strüder, et al. |
| Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors Microsc. Microanal. 22 (Suppl 3); DOI:10.1017/S1431927616003275 |
Knut Müller-Caspary, ... Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, et al. |
